18 Jul Bruker X-ray technology wins award
Madison, Wis. – R&D Magazine has selected Bruker AXS Inc.’s VANTEC-2000 detector for a 2005 R&D 100 Award, which recognizes the most technologically significant products introduced into the marketplace during the past year.
The VANTEC-2000 system is an advanced X-ray diffraction system, a technology useful in the life science, materials science and nanotechnology research fields. It enables users to determine small molecule and protein structures or to characterize and determine the composition and properties of complex substances and nano-materials.
The system measures the two-dimensional X-ray diffraction pattern from a sample, detecting individual photons and allowing for the analysis of weakly and/or strongly scattering samples – including smallest sample traces, single crystals, epitaxial thin films, coatings, rocks, polymers, metals, steel, wood, plastics, liquids, nano-materials and more.
Bruker AXS Inc. is located in suburban Madison.