01 Mar nPoint announces new nanopositioning scanning control mode
MADISON – nPoint, Inc. today announced the availability of an enhanced scanning control mode for nanopositioning stages that incorporates digital signal processing for high scanning speeds.
Nanopositioners are key components in scanning probe microscopes, including atomic force microscopes (AFMs) and related nanotechnology instruments. The enhanced scanning control mode is part of the overall nanopositioner controller. The controller incorporates closed-loop control and is designed to increase data collection in AFM and metrology applications and allow more rapid responses for critical nano-location applications.
The new scanning mode is available for all nPoint nanopositioning stages, including the nPoint iC AFM Upgrade Kit, which provides closed-loop control and metrology capability to scanning probe instruments currently in use. The new mode is also designed to scan faster and with minimal phase-lag between the commanded and achieved position, helping maintain position accuracy at high scanning speeds.
nPoint is a Madison-based provider of precision motion and control nanopositioners for nanoscale research and manufacturing.